Scanning probe microscopy investigation of nanostructured surfaces induced by swift heavy ions

被引：11

作者：

Akcoeltekin, Sevilay ^{[1
]}

Akcoeltekin, Ender ^{[1
]}

Schleberger, Marika ^{[1
]}

Lebius, Henning ^{[2
]}

机构：

[1] Univ Duisburg Essen, D-47048 Duisburg, Germany

[2] CIMAP, F-14070 Caen 5, France

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2009年 / 27卷 / 02期

关键词：

LATENT TRACKS; BEAMS;

D O I：

10.1116/1.3054199

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Swift heavy ions can be used to modify material surfaces on the nanometer scale. In particular, the irradiation of a target surface under grazing angle of incidence offers new possibilities to create chains of individual nanodots with different lengths. The length of these chains can be controlled by the angle of incidence. So far, this method could be successfully applied for insulating materials. The present work dealt with nanosized tracks on the well-known highly oriented pyrolytic graphite surface. By using atomic force microscopy and scanning tunneling microscopy, comparative studies of two different ion beam energies and ion types have been performed. From the analysis of the scanning probe microscopy results, the same track length-angle relation was found, similar to earlier studies on other materials such as SrTiO(3). (C) 2009 American Vacuum Society. [DOI: 10.1116/1.3054199]

引用

收藏

页码：944 / 947

页数：4

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