Performance limiting surface defects in SiC epitaxial p-n junction diodes

被引:186
作者
Kimoto, T [1 ]
Miyamoto, N [1 ]
Matsunami, H [1 ]
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan
关键词
carrier lifetime; high-power device; p-n diode; silicon carbide; surface recombination;
D O I
10.1109/16.748864
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Effects of surface defects on performance of kV-class 4H- and 6H-SiC: epitaxial p-n junction diodes were investigated. The perimeter recombination and generation, instead of the bulk process, are responsible for forward recombination current and reverse leakage current of the diodes, respectively. Mapping studies of surface morphological defects have revealed that triangular-shaped defects severely degrade high-blocking capability of the diodes whereas shallow round pits and scratch give no direct impact. Device-killing defects in SiC epilayers are discussed based on breakdown voltage mapping. Effective minority carrier lifetimes are mainly limited not by bulk recombination but by perimeter recombination.
引用
收藏
页码:471 / 477
页数:7
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