Imaging of Recording Marks and Their Jitters With Different Writing Strategy and Terminal Resistance of Optical Output

被引：7

作者：

Chu, Cheng Hung ^{[1
,4
]}

Wu, Bau Jung ^{[1
]}

Kao, Tsung Sheng ^{[1
,2
]}

Fu, Yuan Hsing ^{[1
,2
]}

Chiang, Hai-Pang ^{[4
]}

Tsai, Din Ping ^{[1
,2
,3
,4
]}

机构：

[1] Natl Taiwan Univ, Dept Phys, Taipei 106, Taiwan

[2] Acad Sinica, Res Ctr Appl Sci, Taipei 115, Taiwan

[3] Instrument Technol Res Ctr, Natl Appl Res Labs, Hsinchu 300, Taiwan

[4] Natl Taiwan Ocean Univ, Inst Optoelect Sci, Chilung 202, Taiwan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2009年 / 45卷 / 05期

关键词：

Conductive-atomic force microscopy (C-AFM); jitter; recording mark; writing strategy; ELECTRON-MICROSCOPY; DISKS; LAYER;

D O I：

10.1109/TMAG.2009.2016156

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.

引用

页码：2221 / 2223

页数：3

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