共 29 条
[1]
Scanning tunneling spectroscopy of inhomogeneous electronic structure in monolayer and bilayer graphene on SiC
[J].
Brar, Victor W.
;
Zhang, Yuanbo
;
Yayon, Yossi
;
Ohta, Taisuke
;
McChesney, Jessica L.
;
Bostwick, Aaron
;
Rotenberg, Eli
;
Horn, Karsten
;
Crommie, Michael F.
.
APPLIED PHYSICS LETTERS,
2007, 91 (12)

Brar, Victor W.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

Zhang, Yuanbo
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

Yayon, Yossi
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

Ohta, Taisuke
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

McChesney, Jessica L.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

Bostwick, Aaron
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

Rotenberg, Eli
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

Horn, Karsten
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

Crommie, Michael F.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
[2]
Electromechanical resonators from graphene sheets
[J].
Bunch, J. Scott
;
van der Zande, Arend M.
;
Verbridge, Scott S.
;
Frank, Ian W.
;
Tanenbaum, David M.
;
Parpia, Jeevak M.
;
Craighead, Harold G.
;
McEuen, Paul L.
.
SCIENCE,
2007, 315 (5811)
:490-493

Bunch, J. Scott
论文数: 0 引用数: 0
h-index: 0
机构: Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

van der Zande, Arend M.
论文数: 0 引用数: 0
h-index: 0
机构: Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

Verbridge, Scott S.
论文数: 0 引用数: 0
h-index: 0
机构: Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

Frank, Ian W.
论文数: 0 引用数: 0
h-index: 0
机构: Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

Tanenbaum, David M.
论文数: 0 引用数: 0
h-index: 0
机构: Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

Parpia, Jeevak M.
论文数: 0 引用数: 0
h-index: 0
机构: Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

Craighead, Harold G.
论文数: 0 引用数: 0
h-index: 0
机构: Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

McEuen, Paul L.
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA
[3]
Bulk production of a new form of sp2 carbon:: Crystalline graphene nanoribbons
[J].
Campos-Delgado, Jessica
;
Romo-Herrera, Jose Manuel
;
Jia, Xiaoting
;
Cullen, David A.
;
Muramatsu, Hiroyuki
;
Kim, Yoong Ahm
;
Hayashi, Takuya
;
Ren, Zhifeng
;
Smith, David J.
;
Okuno, Yu
;
Ohba, Tomonori
;
Kanoh, Hirofumi
;
Kaneko, Katsumi
;
Endo, Morinobu
;
Terrones, Humberto
;
Dresselhaus, Mildred S.
;
Terrones, Mauriclo
.
NANO LETTERS,
2008, 8 (09)
:2773-2778

Campos-Delgado, Jessica
论文数: 0 引用数: 0
h-index: 0
机构:
IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Romo-Herrera, Jose Manuel
论文数: 0 引用数: 0
h-index: 0
机构:
IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Jia, Xiaoting
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Cullen, David A.
论文数: 0 引用数: 0
h-index: 0
机构:
Arizona State Univ, Sch Mat, Tempe, AZ 85287 USA
Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

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Hayashi, Takuya
论文数: 0 引用数: 0
h-index: 0
机构:
Shinshu Univ, Fac Engn, Nagano 3808553, Japan IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Ren, Zhifeng
论文数: 0 引用数: 0
h-index: 0
机构:
Boston Coll, Dept Phys, Chestnut Hill, MA 02467 USA IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Smith, David J.
论文数: 0 引用数: 0
h-index: 0
机构:
Arizona State Univ, Sch Mat, Tempe, AZ 85287 USA
Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Okuno, Yu
论文数: 0 引用数: 0
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机构:
Chiba Univ, Fac Sci, Dept Chem, Mol Chem Grp, Chiba 2638522, Japan IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

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Kanoh, Hirofumi
论文数: 0 引用数: 0
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机构:
Chiba Univ, Fac Sci, Dept Chem, Mol Chem Grp, Chiba 2638522, Japan IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Kaneko, Katsumi
论文数: 0 引用数: 0
h-index: 0
机构:
Chiba Univ, Fac Sci, Dept Chem, Mol Chem Grp, Chiba 2638522, Japan IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Endo, Morinobu
论文数: 0 引用数: 0
h-index: 0
机构:
Shinshu Univ, Fac Engn, Nagano 3808553, Japan IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Terrones, Humberto
论文数: 0 引用数: 0
h-index: 0
机构:
IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Dresselhaus, Mildred S.
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA
MIT, Dept Phys, Cambridge, MA 02139 USA IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico

Terrones, Mauriclo
论文数: 0 引用数: 0
h-index: 0
机构:
IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico IPICYT, Adv Mat Dept, San Luis Potosi 78216, Mexico
[4]
Anisotropic electron-beam damage and the collapse of carbon nanotubes
[J].
Crespi, VH
;
Chopra, NG
;
Cohen, ML
;
Zettl, A
;
Louie, SG
.
PHYSICAL REVIEW B,
1996, 54 (08)
:5927-5931

Crespi, VH
论文数: 0 引用数: 0
h-index: 0
机构:
LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720 LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720

Chopra, NG
论文数: 0 引用数: 0
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机构:
LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720 LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720

Cohen, ML
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机构:
LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720 LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720

Zettl, A
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机构:
LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720 LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720

Louie, SG
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h-index: 0
机构:
LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720 LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720
[5]
Beam-induced damage to thin specimens in an intense electron probe
[J].
Egerton, RF
;
Wang, F
;
Crozier, PA
.
MICROSCOPY AND MICROANALYSIS,
2006, 12 (01)
:65-71

Egerton, RF
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Alberta, Phys Dept, Edmonton, AB T6G 2J1, Canada Univ Alberta, Phys Dept, Edmonton, AB T6G 2J1, Canada

Wang, F
论文数: 0 引用数: 0
h-index: 0
机构: Univ Alberta, Phys Dept, Edmonton, AB T6G 2J1, Canada

Crozier, PA
论文数: 0 引用数: 0
h-index: 0
机构: Univ Alberta, Phys Dept, Edmonton, AB T6G 2J1, Canada
[6]
Free-standing graphene at atomic resolution
[J].
Gass, Mhairi H.
;
Bangert, Ursel
;
Bleloch, Andrew L.
;
Wang, Peng
;
Nair, Rahul R.
;
Geim, A. K.
.
NATURE NANOTECHNOLOGY,
2008, 3 (11)
:676-681

Gass, Mhairi H.
论文数: 0 引用数: 0
h-index: 0
机构:
STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England

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Bleloch, Andrew L.
论文数: 0 引用数: 0
h-index: 0
机构:
STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England

Wang, Peng
论文数: 0 引用数: 0
h-index: 0
机构:
STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England

Nair, Rahul R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England

Geim, A. K.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England STFC Daresbury Lab, SuperSTEM, Warrington WA4 4AD, Cheshire, England
[7]
The rise of graphene
[J].
Geim, A. K.
;
Novoselov, K. S.
.
NATURE MATERIALS,
2007, 6 (03)
:183-191

Geim, A. K.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England

Novoselov, K. S.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England
[8]
Atomic structure of graphene on SiO2
[J].
Ishigami, Masa
;
Chen, J. H.
;
Cullen, W. G.
;
Fuhrer, M. S.
;
Williams, E. D.
.
NANO LETTERS,
2007, 7 (06)
:1643-1648

Ishigami, Masa
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA

Chen, J. H.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA

Cullen, W. G.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA

Fuhrer, M. S.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA

Williams, E. D.
论文数: 0 引用数: 0
h-index: 0
机构: Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA
[9]
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit
[J].
Kisielowski, C.
;
Freitag, B.
;
Bischoff, M.
;
van Lin, H.
;
Lazar, S.
;
Knippels, G.
;
Tiemeijer, P.
;
van der Stam, M.
;
von Harrach, S.
;
Stekelenburg, M.
;
Haider, M.
;
Uhlemann, S.
;
Mueller, H.
;
Hartel, P.
;
Kabius, B.
;
Miller, D.
;
Petrov, I.
;
Olson, E. A.
;
Donchev, T.
;
Kenik, E. A.
;
Lupini, A. R.
;
Bentley, J.
;
Pennycook, S. J.
;
Anderson, I. M.
;
Minor, A. M.
;
Schmid, A. K.
;
Duden, T.
;
Radmilovic, V.
;
Ramasse, Q. M.
;
Watanabe, M.
;
Erni, R.
;
Stach, E. A.
;
Denes, P.
;
Dahmen, U.
.
MICROSCOPY AND MICROANALYSIS,
2008, 14 (05)
:469-477

Kisielowski, C.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Freitag, B.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Bischoff, M.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

van Lin, H.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Lazar, S.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Knippels, G.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Tiemeijer, P.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

van der Stam, M.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

von Harrach, S.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Stekelenburg, M.
论文数: 0 引用数: 0
h-index: 0
机构:
FEI Co, NL-5600 KA Eindhoven, Netherlands Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Haider, M.
论文数: 0 引用数: 0
h-index: 0
机构:
CEOS GmbH, D-69126 Heidelberg, Germany Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Uhlemann, S.
论文数: 0 引用数: 0
h-index: 0
机构:
CEOS GmbH, D-69126 Heidelberg, Germany Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Mueller, H.
论文数: 0 引用数: 0
h-index: 0
机构:
CEOS GmbH, D-69126 Heidelberg, Germany Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Hartel, P.
论文数: 0 引用数: 0
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机构:
CEOS GmbH, D-69126 Heidelberg, Germany Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Kabius, B.
论文数: 0 引用数: 0
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机构:
Argonne Natl Lab, Ctr Electron Microscopy, Argonne, IL USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Miller, D.
论文数: 0 引用数: 0
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机构:
Argonne Natl Lab, Ctr Electron Microscopy, Argonne, IL USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Petrov, I.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Illinois, Ctr Microanal Mat, Urbana, IL 61801 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Olson, E. A.
论文数: 0 引用数: 0
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机构:
Univ Illinois, Ctr Microanal Mat, Urbana, IL 61801 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Donchev, T.
论文数: 0 引用数: 0
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机构:
Univ Illinois, Ctr Microanal Mat, Urbana, IL 61801 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Kenik, E. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Lupini, A. R.
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Bentley, J.
论文数: 0 引用数: 0
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机构:
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Pennycook, S. J.
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Anderson, I. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Minor, A. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Schmid, A. K.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Duden, T.
论文数: 0 引用数: 0
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机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Radmilovic, V.
论文数: 0 引用数: 0
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机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Ramasse, Q. M.
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h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Watanabe, M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Erni, R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Stach, E. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Denes, P.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

Dahmen, U.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA
[10]
Measurement of the elastic properties and intrinsic strength of monolayer graphene
[J].
Lee, Changgu
;
Wei, Xiaoding
;
Kysar, Jeffrey W.
;
Hone, James
.
SCIENCE,
2008, 321 (5887)
:385-388

Lee, Changgu
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USA
Columbia Univ, Def Adv Res Projects Agcy Ctr Integrated Micro Na, New York, NY 10027 USA Columbia Univ, Dept Mech Engn, New York, NY 10027 USA

Wei, Xiaoding
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USA Columbia Univ, Dept Mech Engn, New York, NY 10027 USA

Kysar, Jeffrey W.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USA
Columbia Univ, Ctr Nanostruct Mat, New York, NY 10027 USA Columbia Univ, Dept Mech Engn, New York, NY 10027 USA

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