Size distribution and electroluminescence of self-assembled Ge dots

被引:57
作者
Vescan, L
Stoica, T
Chretien, O
Goryll, M
Mateeva, E
Mück, A
机构
[1] Forschungszentrum Julich, Inst Schicht & Ionentech, D-52425 Julich, Germany
[2] Inst Natl Fiz Mat, R-76900 Bucharest, Romania
[3] Colorado Sch Mines, Dept Met & Mat Engn, Golden, CO USA
关键词
D O I
10.1063/1.372980
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this article we study the electroluminescence of p-i-n diode structures with Ge dots consisting of coherent three-dimensional small (pyramids) and larger (dome) islands. The Ge dots are formed through strain-induced islanding. The diode structures, including one layer with Ge dots, were deposited on Si mesas with variable areas in order to study the influence of limited area deposition on self-assembling. It was observed that the reduction of deposited area improves island uniformity. The combined analysis of island distribution and electroluminescence spectra has lead to the conclusion that domes in small diodes have a smaller Si content or are less relaxed than domes in larger diodes. The diodes are found to emit up to room temperature near the optical communication wavelength of 1.3 microns. (C) 2000 American Institute of Physics. [S0021-8979(00)04610-7].
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收藏
页码:7275 / 7282
页数:8
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