Charge imaging and manipulation using carbon nanotube probes

被引：20

作者：

Tzeng, SD ^{[1
]}

Wu, CL

You, YC

Chen, TT

Gwo, S

Tokumoto, H

机构：

[1] Natl Tsing Hua Univ, Dept Phys, Hsinchu 300, Taiwan

[2] Natl Inst Adv Ind Sci & Technol, Nanotechnol Res Inst, Cent 4, Tsukuba, Ibaraki 3058562, Japan

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 26期

关键词：

D O I：

10.1063/1.1530377

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Due to their high aspect ratio, well-defined cylindrical structure, and good electrical conductivity, carbon nanotubes (CNTs) are ideal probes for "true" local imaging of electric domain structures at the nanoscale. By performing force-distance measurements and tip-shape profiling with a uniformly charged oxide square, we clearly demonstrate the local nature of the CNT tip for electrostatic force microscopy. We show that CNTs can be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm. (C) 2002 American Institute of Physics.

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收藏

页码：5042 / 5044

页数：3

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