Temperature Dependence in the Long-Term Stability of the TlBr Detector

被引:12
作者
da Costa, Fabio Eduardo [1 ]
de Mesquita, Carlos Henrique [1 ]
Hamada, Margarida Mizue [1 ]
机构
[1] CNEN SP, IPEN, BR-05508900 Sao Paulo, Brazil
基金
巴西圣保罗研究基金会;
关键词
Detector stability; polarization; semiconductor detector; Thallium bromide;
D O I
10.1109/TNS.2009.2024678
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, TlBr detectors with three-electrodes were prepared and their long term stability evaluated as a function of the temperature. Systematic measurements of counting rate were carried out to observe the random pulse formation, due to the polarization effect. Three-electrode detectors presented stability of about 112 h at near room temperature and more than 325 h at 0 degrees C Although the three-electrode detector presents a better performance compared to the two-electrode detector, its stability has been still dependent on the temperature.
引用
收藏
页码:1817 / 1822
页数:6
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