Electronic structure of GaN stacking faults

被引:55
作者
Bandic, ZZ [1 ]
McGill, TC [1 ]
Ikonic, Z [1 ]
机构
[1] UNIV BELGRADE, SCH ELECT ENGN, YU-11000 BELGRADE, YUGOSLAVIA
关键词
D O I
10.1103/PhysRevB.56.3564
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The calculation of the electronic structure of the GaN stacking faults in the framework of the local empirical pseudopotential theory is presented. The stacking faults in both zinc-blende and wurtzite GaN are predicted to introduce electronic levels within the band gap, with the energy (0.13+/-0.01) eV above the valence-band top. These levels are found to originate from interface states of heterocrystalline wurtzite (0001)-zinc-blende (111) interfaces. The possible implications of stacking fault electronic states on the luminescence properties of GaN are discussed.
引用
收藏
页码:3564 / 3566
页数:3
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