A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions

被引：23

作者：

Weitz, P ^{[1
]}

Ahlswede, E ^{[1
]}

Weis, J ^{[1
]}

Von Klitzing, K ^{[1
]}

Eberl, K ^{[1
]}

机构：

[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

来源：

APPLIED SURFACE SCIENCE | 2000年 / 157卷 / 04期

关键词：

scanning probe microscopy; Kelvin probe force microscopy; quantum Hall effect;

D O I：

10.1016/S0169-4332(99)00550-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A low-temperature scanning force microscope sensitive to electrostatics has been constructed for investigating a two-dimensional electron system (2DES) under quantum Hall conditions. In order to cope with the highly resistive properties of the 2DES under these conditions, a low-frequency measurement technique is presented, based on the shift of the cantilever's resonance frequency induced by a small ac current modulation within the 2DES. Since the 2DES is buried in a GaAs/AlGaAs heterostructure, a special calibration technique has to be applied, which allows to map Hall-potential profiles with clearly submicron resolution (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：349 / 354

页数：6

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