Novel top-gate zinc oxide thin-film transistors (ZnO TFTs) for AMLCDs

被引:98
作者
Hirao, Takashi
Furuta, Mamoru
Furuta, Hiroshi
Matsuda, Tokiyoshi
Hiramatsu, Takahiro
Hokari, Hitoshi
Yoshida, Motohiko
Ishii, Hiromitsu
Kakegawa, Masayuki
机构
[1] Kochi Univ Technol, Res Inst, Kochi 7828502, Japan
[2] Kochi Ind Promot Ctr, Kochi, Japan
[3] Casio Comp Co Ltd, Tokyo, Japan
[4] Kochi Casio Co Ltd, Kochi, Japan
关键词
transparent oxide semiconductor; zinc oxide (ZnO); thin-film transistor (TFT); top gate; ZnO; TFT; AMLCDs;
D O I
10.1889/1.2451545
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-performance top-gate thin-film transistors (TFTs) with a transparent zinc oxide (ZnO) channel have been developed. ZnO thin films used as active channels were deposited by rf magnetron sputtering. The electrical properties and thermal stability of the ZnO films are controlled by the deposition conditions. A gate insulator made of silicon nitride (SiNx) was deposited on the ZnO films by conventional P-CVD. A novel ZnO-TFT process based on photolithography is proposed for AMLCDs. AMLCDs having an aperture ratio and pixel density comparable to those of a-Si: H TFT-LCDs are driven by ZnO TFTs using the same driving scheme of conventional AMLCDs.
引用
收藏
页码:17 / 22
页数:6
相关论文
共 15 条
[1]   Transparent ZnO thin-film transistor fabricated by rf magnetron sputtering [J].
Carcia, PF ;
McLean, RS ;
Reilly, MH ;
Nunes, G .
APPLIED PHYSICS LETTERS, 2003, 82 (07) :1117-1119
[2]   High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer [J].
Chiang, HQ ;
Wager, JF ;
Hoffman, RL ;
Jeong, J ;
Keszler, DA .
APPLIED PHYSICS LETTERS, 2005, 86 (01) :013503-1
[3]   Transparent thin-film transistors with zinc indium oxide channel layer [J].
Dehuff, NL ;
Kettenring, ES ;
Hong, D ;
Chiang, HQ ;
Wager, JF ;
Hoffman, RL ;
Park, CH ;
Keszler, DA .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (06)
[4]   Wide-bandgap high-mobility ZnO thin-film transistors produced at room temperature [J].
Fortunato, EMC ;
Barquinha, PMC ;
Pimentel, ACMBG ;
Gonçalves, AMF ;
Marques, AJS ;
Martins, RFP ;
Pereira, LMN .
APPLIED PHYSICS LETTERS, 2004, 85 (13) :2541-2543
[5]   BOTTOM-GATE POLY-SI THIN-FILM TRANSISTORS USING XECL EXCIMER-LASER ANNEALING AND ION DOPING TECHNIQUES [J].
FURUTA, M ;
KAWAMURA, T ;
YOSHIOKA, T ;
MIYATA, Y .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (11) :1964-1969
[6]  
HIRAMATSU T, UNPUB 13 INT DISPL W
[7]   ZnO-based transparent thin-film transistors [J].
Hoffman, RL ;
Norris, BJ ;
Wager, JF .
APPLIED PHYSICS LETTERS, 2003, 82 (05) :733-735
[8]   Transparent thin film transistors using ZnO as an active channel layer and their electrical properties [J].
Masuda, S ;
Kitamura, K ;
Okumura, Y ;
Miyatake, S ;
Tabata, H ;
Kawai, T .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (03) :1624-1630
[9]  
NISHIBE T, 2004, AMLCD 04, P85
[10]   High mobility thin film transistors with transparent ZnO channels [J].
Nishii, J ;
Hossain, FM ;
Takagi, S ;
Aita, T ;
Saikusa, K ;
Ohmaki, Y ;
Ohkubo, I ;
Kishimoto, S ;
Ohtomo, A ;
Fukumura, T ;
Matsukura, F ;
Ohno, Y ;
Koinuma, H ;
Ohno, H ;
Kawasaki, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2003, 42 (4A) :L347-L349