Confirmation of the INRiM and PTB determinations of the Si lattice parameter

被引：25

作者：

Becker, Peter

Cavagnero, Giovanni

Kuetgens, Ulrich

Mana, Giovanni

Massa, Enrico

机构：

[1] Phys Tech Bundesanstalt, Dept Quantum Metrol, Working Grp Xray Opt & Crystals, D-38116 Braunschweig, Germany

[2] Phys Tech Bundesanstalt, Length Unit, Opt Div, D-38116 Braunschweig, Germany

[3] Ist Nazl Ric Metrol, I-10135 Turin, Italy

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2007年 / 56卷 / 02期

关键词：

Avogadro's constant; combined X-ray and optical interferometry; Si lattice parameter;

D O I：

10.1109/TIM.2007.890618

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Measurements of the (220) lattice plane spacing of Si by combined X-ray and optical interferometry, which had been carried out to resolve a discrepancy between previous determinations, have been reported. However, it was subsequently found that the laser beam used to measure the displacement of the X-ray interferometer was contaminated by a parasitic component having a different optical frequency. The new measurement results given here are intended to assess the relevant correction.

引用

页码：230 / 234

页数：5

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