Measurement repetitions of the Si(220) lattice spacing

被引：27

作者：

Cavagnero, G

Fujimoto, H

Mana, G

Massa, E

Nakayama, K

Zosi, G

机构：

[1] CNR, Ist Metrol G Colonnetti, I-10135 Turin, Italy

[2] Natl Metrol Inst Japan, Tsukuba, Ibaraki 3058563, Japan

[3] Univ Turin, Dipartimento Fis Gen A Avogadro, I-10125 Turin, Italy

来源：

METROLOGIA | 2004年 / 41卷 / 01期

关键词：

D O I：

10.1088/0026-1394/41/1/008

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

This paper presents the results of measurements carried out at the Istituto di Metrologia 'G Colonnetti' (IMGC) and the National Metrology Institute of Japan (NMIJ) in order to investigate the disagreement between the respective past determinations of the (220) lattice spacing of Si. A bug in the past IMGC experiment has been identified and eliminated. The discrepancy having been removed, improved lattice spacing values are given. Basically, these values confirm the NMIJ determination but not the IMGC one.

引用

页码：56 / 64

页数：9

共 26 条

[1]

[Anonymous], 1995, GUID EXPR UNC MEAS

[2] A NEW DETERMINATION OF N-A [J].

BASILE, G ;

BECKER, P ;

BERGAMIN, A ;

BETTIN, H ;

CAVAGNERO, G ;

DEBIEVRE, P ;

KUTGENS, U ;

MANA, G ;

MOSCA, M ;

PAJOT, B ;

PANCIERA, R ;

PASIN, W ;

PETTORRUSO, S ;

PEUTO, A ;

SACCONI, A ;

STUMPEL, J ;

VALKIERS, S ;

VITTONE, E ;

ZOSI, G .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :538-541

[3] SILICON LATTICE-CONSTANT - LIMITS IN IMGC X-RAY OPTICAL INTERFEROMETRY [J].

BASILE, G ;

BERGAMIN, A ;

CAVAGNERO, G ;

MANA, G ;

VITTONE, E ;

ZOSI, G .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1991, 40 (02) :98-102

[4] MEASUREMENT OF THE SILICON (220) LATTICE SPACING [J].

BASILE, G ;

BERGAMIN, A ;

CAVAGNERO, G ;

MANA, G ;

VITTONE, E ;

ZOSI, G .

PHYSICAL REVIEW LETTERS, 1994, 72 (20) :3133-3136

[5] Determination of the Avogadro constant via the silicon route [J].

Becker, P ;

Bettin, H ;

Danzebrink, HU ;

Gläser, M ;

Kuetgens, U ;

Nicolaus, A ;

Schiel, D ;

De Bièvre, P ;

Valkiers, S ;

Taylor, P .

METROLOGIA, 2003, 40 (05) :271-287

[6] History and progress in the accurate determination of the Avogadro constant [J].

Becker, P .

REPORTS ON PROGRESS IN PHYSICS, 2001, 64 (12) :1945-2008

[7] ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL [J].

BECKER, P ;

DORENWENDT, K ;

EBELING, G ;

LAUER, R ;

LUCAS, W ;

PROBST, R ;

RADEMACHER, HJ ;

REIM, G ;

SEYFRIED, P ;

SIEGERT, H .

PHYSICAL REVIEW LETTERS, 1981, 46 (23) :1540-1543

[8] Lattice parameter and thermal expansion of monocrystalline silicon [J].

Bergamin, A ;

Cavagnero, G ;

Mana, G ;

Zosi, G .

JOURNAL OF APPLIED PHYSICS, 1997, 82 (11) :5396-5400

[9]

Bergamin A, 1999, EUR PHYS J B, V9, P225, DOI 10.1007/s100510050760

[10] A two-axis tip-tilt platform for x-ray interferometry [J].

Bergamin, A ;

Cavagnero, G ;

Durando, G ;

Mana, G ;

Massa, E .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2003, 14 (06) :717-723

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