Neel "orange-peel" coupling in magnetic tunneling junction devices

被引：146

作者：

Schrag, BD ^{[1
]}

Anguelouch, A

Ingvarsson, S

Xiao, G

Lu, Y

Trouilloud, PL

Gupta, A

Wanner, RA

Gallagher, WJ

Rice, PM

Parkin, SSP

机构：

[1] Brown Univ, Dept Phys, Providence, RI 02912 USA

[2] IBM Corp, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA

[3] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 15期

关键词：

D O I：

10.1063/1.1315633

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present measurements of the magnitude of Neel "orange-peel" coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in good agreement with the theoretical model of Neel. In addition, we have used transmission electron microscopy to directly probe the sample interface roughness and obtain results consistent with the values obtained by magnetometry and transport methods. (C) 2000 American Institute of Physics. [S0003-6951(00)00541-6].

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页码：2373 / 2375

页数：3

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