Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material

被引：121

作者：

Schubert, Martin F. ^{[1
]}

Xi, J. -Q. ^{[1
]}

Kim, Jong Kyu ^{[1
]}

Schubert, E. Fred ^{[1
]}

机构：

[1] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA

来源：

APPLIED PHYSICS LETTERS | 2007年 / 90卷 / 14期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2720269

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A conductive distributed Bragg reflector (DBR) composed entirely of a single material-indium tin oxide (ITO)-is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Delta n=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.

引用

页数：3

共 20 条

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