Fine structure of photoluminescence spectra from erbium incorporated with iron in oxidized porous silicon

被引：6

作者：

Bondarenko, V

Kazuchits, N

Volchek, S

Dolgyi, L

Petrovich, V

Yakovtseva, V

Gaiduk, P

Balucani, M

Lamedica, G

Ferrari, A ^{[1
]}

机构：

[1] Univ Roma La Sapienza, INFM, Unit Res E6, I-00184 Rome, Italy

[2] Belarussian State Univ Informat & Radioelect, Minsk 220013, BELARUS

[3] Belarusian State Univ, Minsk 220050, BELARUS

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2003年 / 197卷 / 02期

关键词：

D O I：

10.1002/pssa.200306541

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report 77 K Photoluminescence (PL) and Photoluminescence Excitation (PLE) spectroscopies of Er ions incorporated with Fe in oxidized porous silicon (OPS) in the form of 5-50 nm sized clusters containing Fe, 0, and Er. Twenty sharp (FWHM of about 0.4 meV) PL peaks related to the transitions between highly split levels of I-4(13/2) and I-4(15/2) multiplets were observed. Two different Er centers having cubic and lower than cubic symmetries were identified. The photoluminescence excitation spectrum of the 1533 nm PL peak comprises no resonant features but a broad band spanning from 300 to 570 nm. The mechanism of excitation of Er ions through Fe : 0 : Er nanoclusters in the OPS host is presented.

引用

页码：441 / 445

页数：5

共 14 条

[11] CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON [J].