Self-organized quantum dot formation by ion sputtering

被引:20
作者
Facsko, S [1 ]
Dekorsy, T [1 ]
Trappe, C [1 ]
Kurz, H [1 ]
机构
[1] Rhein Westfal TH Klinikum, Inst Semicond Elect, D-52074 Aachen, Germany
关键词
D O I
10.1016/S0167-9317(00)00307-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Key requirements for the fabrication of semiconductor quantum dots (QD) are their size, size distribution and density. Beyond conventional lithography methods self-organization processes are promising for the realization of QDs. We present a new route for the generation of quantum dots, which in contrast to epitaxial growth is a subtractive self-organized and self-ordered method. It is based on a surface instability induced by low energy and normal incidence ion bombardment of semiconductor surfaces. Uniform crystalline islands with dimensions as small as 15 nm and densities up to 10(11) cm(-2) are formed by a cooperative process on the surface of semiconductors during continuous ion sputtering.
引用
收藏
页码:245 / 248
页数:4
相关论文
共 12 条
[1]   MULTIDIMENSIONAL QUANTUM WELL LASER AND TEMPERATURE-DEPENDENCE OF ITS THRESHOLD CURRENT [J].
ARAKAWA, Y ;
SAKAKI, H .
APPLIED PHYSICS LETTERS, 1982, 40 (11) :939-941
[2]   ION INTERACTION WITH SOLIDS - SURFACE TEXTURING, SOME BULK EFFECTS, AND THEIR POSSIBLE APPLICATIONS [J].
AUCIELLO, O .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04) :841-867
[3]   THEORY OF RIPPLE TOPOGRAPHY INDUCED BY ION-BOMBARDMENT [J].
BRADLEY, RM ;
HARPER, JME .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (04) :2390-2395
[4]   Roughening and ripple instabilities on ion-bombarded Si [J].
Carter, G ;
Vishnyakov, V .
PHYSICAL REVIEW B, 1996, 54 (24) :17647-17653
[5]  
CARTER G, 1991, SPUTTERING PARTICLE, V64
[6]   ROUGHENING INSTABILITY AND EVOLUTION OF THE GE(001) SURFACE DURING ION SPUTTERING [J].
CHASON, E ;
MAYER, TM ;
KELLERMAN, BK ;
MCILROY, DT ;
HOWARD, AJ .
PHYSICAL REVIEW LETTERS, 1994, 72 (19) :3040-3043
[7]   DYNAMIC SCALING OF ION-SPUTTERED SURFACES [J].
CUERNO, R ;
BARABASI, AL .
PHYSICAL REVIEW LETTERS, 1995, 74 (23) :4746-4749
[8]   STOCHASTIC-MODEL FOR SURFACE EROSION VIA ION SPUTTERING - DYNAMICAL EVOLUTION FROM RIPPLE MORPHOLOGY TO ROUGH MORPHOLOGY [J].
CUERNO, R ;
MAKSE, HA ;
TOMASSONE, S ;
HARRINGTON, ST ;
STANLEY, HE .
PHYSICAL REVIEW LETTERS, 1995, 75 (24) :4464-4467
[9]   Formation of ordered nanoscale semiconductor dots by ion sputtering [J].
Facsko, S ;
Dekorsy, T ;
Koerdt, C ;
Trappe, C ;
Kurz, H ;
Vogt, A ;
Hartnagel, HL .
SCIENCE, 1999, 285 (5433) :1551-1553
[10]   ROUGHENING INSTABILITY AND ION-INDUCED VISCOUS RELAXATION OF SIO2 SURFACES [J].
MAYER, TM ;
CHASON, E ;
HOWARD, AJ .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (03) :1633-1643