Ga/In-intermixing and segregation during InAs quantum dot formation

被引:16
作者
Heyn, C
Hansen, W
机构
[1] Inst Angew Phys, D-20355 Hamburg, Germany
[2] Zentrum Mikrostrukurforsch, D-20355 Hamburg, Germany
关键词
growth models; low-dimensional structures; nucleation; reflection high-energy electron diffraction; segregation; semiconducting III-V materials;
D O I
10.1016/S0022-0248(02)02380-1
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Intermixing with Ga from the substrate, and In over Ga segregation during strain-induced formation of InGaAs quantum dots are studied experimentally with electron diffraction (RHEED) and theoretically with a kinetic rate equations-based growth model. Our growth model yields the temperature-dependent critical time for quantum dot formation. The results reproduce our RHEED data very well. Furthermore, the quantum dot volume calculated with the model agrees with independent measurements. Calculations of the time-dependent strain energy inside the quantum dots establish strain-relaxation by quantum dot formation. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:140 / 144
页数:5
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