Annealing effect on the structural and magnetic properties of nickel ferrite thin films

被引：28

作者：

Dixit, G. ^{[1
,2
]}

Singh, J. P. ^{[2
]}

Srivastava, R. C. ^{[2
]}

Agrawal, H. M. ^{[2
]}

Choudhary, R. J. ^{[1
]}

Gupta, A. ^{[1
]}

机构：

[1] UGC DAE CSR, Indore 452017, Madhya Pradesh, India

[2] Govind Ballabh Pant Univ Agr & Technol, Dept Phys, Pantnagar 263145, Uttarakhnad, India

来源：

SURFACE AND INTERFACE ANALYSIS | 2010年 / 42卷 / 03期

关键词：

ferrites; thin films; annealing; PLD; XRD; Raman spectroscopy; VSM; XRR; PULSED-LASER DEPOSITION; BEHAVIOR; GROWTH;

D O I：

10.1002/sia.3195

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Nickel ferrite is a soft magnetic material with inverse spinel structure. Soft ferrite films are used in microwave devices, integrated planar circuits, etc., because of their high resistivity. In this work, thin films of nickel ferrite were deposited on Si (100) substrate by using pulsed laser deposition (PLD) technique. The thickness of the film was measured by surface profilometer and also by X-ray reflectivity (XRR). The films were annealed at three different temperatures to observe the effect on the structural and magnetic properties of the film. The films were characterised by X-ray diffraction (XRD), Raman spectroscopy and vibrating sample magnetometer (VSM) to study the structural and magnetic properties. Copyright (C) 2010 John Wiley & Sons, Ltd.

引用

页码：151 / 156

页数：6

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