Application of x-ray direct methods to surface reconstructions: The solution of projected superstructures

被引:27
作者
Torrelles, X [1 ]
Rius, J
Boscherini, F
Heun, S
Mueller, BH
Ferrer, S
Alvarez, J
Miravitlles, C
机构
[1] Inst Ciencia Mat Barcelona, CSIC, Bellaterra 08193, Catalunya, Spain
[2] Ist Nazl Fis Nucl, Lab Nazl Frascati, I-00044 Rome, Italy
[3] INFM, Lab TASC, I-34012 Trieste, Italy
[4] European Synchrotron Radiat Facil, F-38043 Grenoble, France
来源
PHYSICAL REVIEW B | 1998年 / 57卷 / 08期
关键词
D O I
10.1103/PhysRevB.57.R4281
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The projections of surface reconstructions are normally solved fi om the interatomic vectors found in two-dimensional Patterson maps computed with the intensities of the in-plane superstructure reflections. Since for difficult reconstructions this procedure is not trivial, an alternative automated one based on the "direct methods" sum function [Rius, Miravitlles, and Allmann, Acta Crystallogr. A52, 634 (1996)] is shown. It has been applied successfully to the known c(4 X 2) reconstruction of Ge(001) and to the so-far unresolved In0.04Ga0.96As (001) p(4 X 2) surface reconstruction. For this last system we propose a modification of one of the models previously proposed for GaAs(001) whose characteristic feature is the presence of dimers along the fourfold direction. [S0163-1829(98)50908-3].
引用
收藏
页码:R4281 / R4284
页数:4
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