Interface composition and stacking fault density in II-VI/III-V heterostructures

被引:31
作者
Heun, S
Paggel, JJ
Sorba, L
Rubini, S
Franciosi, A
Bonard, JM
Ganiere, JD
机构
[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455
[2] ECOLE POLYTECH FED LAUSANNE,DEPT PHYS,INST MICRO & OPTOELECT,CH-1015 LAUSANNE,SWITZERLAND
[3] CNR,IST ICMAT,I-00016 ROME,ITALY
[4] UNIV TRIESTE,DIPARTMENTO FIS,I-34127 TRIESTE,ITALY
关键词
D O I
10.1063/1.118338
中图分类号
O59 [应用物理学];
学科分类号
摘要
The Zn/Se flux ratio employed during the early stages of molecular beam epitaxy of pseudomorphic ZnSe/GaAs(001) as well as lattice-matched ZnSe/In0.04Ga0.96As(001) heterostructures controls the density of the native stacking faults, which have been associated with the early degradation of blue-green lasers. In particular, the density of Shockley stacking fault pairs decreases by three to four orders of magnitude and that of Frank stacking faults by one order of magnitude in going from Zn-rich to Se-rich interfaces. (C) 1997 American Institute of Physics.
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收藏
页码:237 / 239
页数:3
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