Sealing AlAs against oxidative decomposition and its use in device fabrication

被引:10
作者
Huffaker, DL [1 ]
Deppe, DG [1 ]
Lei, C [1 ]
Hodge, LA [1 ]
机构
[1] HEWLETT PACKARD CORP, COMPONENTS GRP, OPT COMMUN DIV, SAN JOSE, CA 95131 USA
关键词
D O I
10.1063/1.115635
中图分类号
O59 [应用物理学];
学科分类号
摘要
Data are presented demonstrating that an exposed AlAs layer can be sealed against further decomposition as would otherwise occur due to, for example, wet oxidation. A critical processing step consists of a brief 500-600 degrees C anneal in forming gas of a previously room ambient exposed AlGaAs surface. In the brief high-temperature anneal, a thin but dense surface barrier layer forms which further blocks diffusing oxygen species. The effectiveness of the surface layer as a barrier is demonstrated through its use as a mask against wet oxidation in the fabrication of an all-epitaxial selectively oxidized multimode AlAs/AlGaAs vertical-cavity laser. (C) 1996 American Institute of Physics.
引用
收藏
页码:1948 / 1950
页数:3
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