On the roughness of single- and bi-layer graphene membranes

被引：470

作者：

Meyer, J. C.

Geim, A. K.

Katsnelson, M. I.

Novoselov, K. S.

Obergfell, D.

Roth, S.

Girit, C.

Zettl, A.

机构：

[1] Univ Calif Berkeley, Dept Mat Sci, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] Univ Manchester, Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England

[4] Radboud Univ Nijmegen, Inst Mol & Mat, NL-6525 ED Nijmegen, Netherlands

[5] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany

来源：

SOLID STATE COMMUNICATIONS | 2007年 / 143卷 / 1-2期

基金：

美国国家科学基金会; 英国工程与自然科学研究理事会;

关键词：

thin films; nanofabrication; transmission electron microscopy; mechanical properties; CRYSTALLINE; SCATTERING;

D O I：

10.1016/j.ssc.2007.02.047

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We present a detailed transmission electron microscopy and electron diffraction study of the thinnest possible membrane, a single layer of carbon atoms suspended in vacuum and attached only at its edges. Membranes consisting of two graphene layers are also reported. We find that the membranes exhibit random microscopic curvature that is strongest in single-layer membranes. A direct visualization of the roughness is presented for two-layer membranes where we used the variation of diffracted intensities with the local orientation of the membrane. (c) 2007 Elsevier Ltd. All rights reserved.

引用

页码：101 / 109

页数：9

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