Observation of nano-dewetting structures

被引：80

作者：

Muller-Buschbaum, P ^{[1
]}

Vanhoorne, P ^{[1
]}

Scheumann, V ^{[1
]}

Stamm, M ^{[1
]}

机构：

[1] Max Planck Inst Polymerforsch, D-55128 Mainz, Germany

来源：

EUROPHYSICS LETTERS | 1997年 / 40卷 / 06期

关键词：

D O I：

10.1209/epl/i1997-00519-4

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have studied the dewetting of thin polymer films (polystyrene) on top of different silicon substrates. With diffuse X-ray scattering and scanning-force microscopy a high in-plane resolution was achieved. Besides the well-known mesoscopic dewetting structures of drops with diameters in the range of several micrometers we detect a further morphological feature. Depending on the thickness of the native silicon oxide layer, inside the dewetted areas small dimples are formed. This nano-dewetting structure can be understood as the result of the dewetting of a remaining ultra-thin film and is compared with theoretical predictions of spinodal decomposition. This observation of another length scale provides some new aspects on the molecular mechanism of polymer dewetting.

引用

页码：655 / 660

页数：6

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