Effect of surface morphology of Ni thin film on the growth of aligned carbon nanotubes by microwave plasma-enhanced chemical vapor deposition

被引:92
作者
Choi, YC
Shin, YM
Lim, SC
Bae, DJ
Lee, YH [1 ]
Lee, BS
Chung, DC
机构
[1] Jeonbuk Natl Univ, Dept Semicond Sci & Technol, Jeonju 561756, South Korea
[2] Jeonbuk Natl Univ, Semicond Phys Res Ctr, Jeonju 561756, South Korea
[3] Woosuk Univ, Div Informat Commun & Comp Engn, Wanju 565701, South Korea
[4] Jeonbuk Natl Univ, Dept Phys, Jeonju 561756, South Korea
[5] Jeonbuk Natl Univ, Div Adv Mat Engn, Jeonju 561756, South Korea
关键词
D O I
10.1063/1.1314614
中图分类号
O59 [应用物理学];
学科分类号
摘要
Aligned carbon nanotubes were synthesized on Ni-coated Si substrates using microwave plasma-enhanced chemical vapor deposition. The surface morphology of Ni thin films was varied with the rf power density during the rf magnetron sputtering process. It was found that the growth of carbon nanotubes was strongly influenced by the surface morphology of Ni thin film. Pure carbon nanotubes were synthesized on Ni thin film with uniformly distributed grain sizes, whereas large amounts of carbonaceous particles were produced in addition to the nanotubes, when the nanotubes were grown on Ni thin film with widely distributed grain sizes. With decreasing Ni-grain size, the diameter of nanotubes decreased and the length increased. High-resolution transmission electron microscope images clearly demonstrated the nanotubes to be multiwalled, and the graphitized structures were confirmed from the Raman spectra. Efficient field emission was observed from the diode structure with the nanotube tips. (C) 2000 American Institute of Physics. [S0021-8979(00)00522-3].
引用
收藏
页码:4898 / 4903
页数:6
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