Focused electron beam induced deposition of gold

被引:143
作者
Utke, I [1 ]
Hoffmann, P
Dwir, B
Leifer, K
Kapon, E
Doppelt, P
机构
[1] Swiss Fed Inst Technol, Microengn Dept, EPFL DMT IOA, EPFL, CH-1015 Lausanne, Switzerland
[2] Swiss Fed Inst Technol, Dept Phys, EPFL DP IMO, CH-1015 Lausanne, Switzerland
[3] CNRS, Ecole Super Phys & Chim Ind, F-75231 Paris, France
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 06期
关键词
D O I
10.1116/1.1319690
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Codeposition of hydrocarbons is a severe problem during focused electron beam writing of purr: metal nanostructures. When using organometallic precursors, a low metal content carbonaceous matrix embedding and separating numerous nanosized metal clusters is formed. Tn this work, we present a new and easy approach to obtain high purity gold lines: the use of inorganic PF3AuCl as a precursor. Electrical resistivities as low as 22 mu Omega cm at 295 K (ten times the bulk Au value) were obtained. This is to our knowledge the best value for focused electron beam deposition obtained from the vapor phase so far. No special care was taken to prevent hydrocarbon contamination. The deposited nanostructure consists of gold grains varying in size and percolation with beam parameters. (C) 2000 American Vacuum Society. [S0734-211X(00)06906-7].
引用
收藏
页码:3168 / 3171
页数:4
相关论文
共 15 条
  • [1] The production of fine metal tracks from a new range of organometallic compounds
    Berry, GJ
    Cairns, JA
    Thomson, J
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 1995, 51 (01) : 47 - 50
  • [2] DOPPELT P, IN PRESS ADV MAT CHE
  • [3] ELECTRON-BEAM DEPOSITION OF GOLD NANOSTRUCTURES IN A REACTIVE ENVIRONMENT
    FOLCH, A
    TEJADA, J
    PETERS, CH
    WRIGHTON, MS
    [J]. APPLIED PHYSICS LETTERS, 1995, 66 (16) : 2080 - 2082
  • [4] Laser assisted focused-ion-beam-induced deposition of copper
    Funatsu, J
    Thompson, CV
    Melngailis, J
    Walpole, JN
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (01): : 179 - 180
  • [5] HOFFMANN P, 2000, UNPUB P MAT RES SOC
  • [6] KODAS T, 1994, CHEM METAL CVD, P228
  • [7] ELECTRON-BEAM INDUCED TUNGSTEN DEPOSITION - GROWTH-RATE ENHANCEMENT AND APPLICATIONS IN MICROELECTRONICS
    KOHLMANNVONPLATEN, KT
    BUCHMANN, LM
    PETZOLD, HC
    BRUNGER, WH
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (06): : 2690 - 2694
  • [8] CHARACTERIZATION AND APPLICATION OF MATERIALS GROWN BY ELECTRON-BEAM-INDUCED DEPOSITION
    KOOPS, HWP
    KRETZ, J
    RUDOLPH, M
    WEBER, M
    DAHM, G
    LEE, KL
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (12B): : 7099 - 7107
  • [9] Conductive dots, wires, and supertips for field electron emitters produced by electron-beam induced deposition on samples having increased temperature
    Koops, HWP
    Schossler, C
    Kaya, A
    Weber, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 4105 - 4109
  • [10] Direct patterning of noble metal nanostructures with a scanning tunneling microscope
    Marchi, F
    Tonneau, D
    Dallaporta, H
    Safarov, V
    Bouchiat, V
    Doppelt, P
    Even, R
    Beitone, L
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (03): : 1171 - 1176