Effect of growth temperature on ZnO thin film deposited on SiO2 substrate

被引:55
作者
Kim, KS [1 ]
Kim, HW [1 ]
Lee, CM [1 ]
机构
[1] Inha Univ, Sch Mat Sci & Engn, Inchon 402751, South Korea
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2003年 / 98卷 / 02期
关键词
MOCVD; ZnO; low temperature; thin film;
D O I
10.1016/S0921-5107(02)00754-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the effect of deposition temperature on the growth and structural quality of ZnO films on SiO2 substrate in the range of 100-250 degreesC using the metal organic chemical vapor deposition (MOCVD) technique. We revealed that highly c-axis oriented ZnO thin films were obtained at the temperature of 200-250 degreesC and the ZnO thin film was successfully deposited at the lower temperature of 100-150 degreesC. The c-axis orientation of the film improved and the grain size increased by increasing growth temperature. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:135 / 139
页数:5
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