Midinfrared photoconductivity of Ge/Si self-assembled quantum dots

被引:55
作者
Rappaport, N [1 ]
Finkman, E
Brunhes, T
Boucaud, P
Sauvage, S
Yam, N
Le Thanh, V
Bouchier, D
机构
[1] Technion Israel Inst Technol, Dept Elect Engn, IL-32000 Haifa, Israel
[2] Technion Israel Inst Technol, Inst Solid State, IL-32000 Haifa, Israel
[3] Univ Paris Sud, Inst Elect Fondamentale, CNRS, UMR 8622, F-91405 Orsay, France
关键词
D O I
10.1063/1.1326044
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the midinfrared photoconductivity of Ge/Si self-assembled quantum dots. The self-assembled quantum dots were grown by ultra-high-vacuum chemical vapor deposition on Si(001). The photoresponse of the p-type device exhibits resonances in the midinfrared around 10 mum wavelength. The resonance of the photocurrent shifts to lower energy as the applied bias increases. The photocurrent is weakly dependent on the incoming polarization of the infrared light. The photocurrent is analyzed in terms of bound-to-bound and bound-to-continuum transitions in the valence band. The photocurrent peaks are correlated to the photoluminescence of the device. (C) 2000 American Institute of Physics. [S0003-6951(00)04046-8].
引用
收藏
页码:3224 / 3226
页数:3
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