A SCANNING TUNNELING AND TRANSMISSION ELECTRON-MICROSCOPY COMPARISON OF THE SURFACE-STRUCTURE OF EVAPORATED AND ION-ASSISTED GOLD-FILMS

被引：12

作者：

BARTLETT, R

JAEGER, H

SEXTON, BA

NETTERFIELD, RP

MARTIN, PJ

机构：

[1] CSIRO,DIV MAT SCI & TECHNOL,LOCKED BAG 33,CLAYTON,VIC 3168,AUSTRALIA

[2] CSIRO,DIV APPL PHYS,LINDFIELD,NSW 2070,AUSTRALIA

来源：

APPLIED SURFACE SCIENCE | 1991年 / 47卷 / 02期

关键词：

D O I：

10.1016/0169-4332(91)90032-F

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The surface topography of evaporated and ion-assisted deposited gold films on silica has been studied by scanning tunnelling and transmission electron microscopy. Both techniques demonstrate that the bulk microstructures of the ion-assisted films have lower average dimensions than that of the evaporated films. The STM is used to compare the surface roughness of the evaporated and ion-assisted films. We discuss some of the difficulties in identifying grain sizes and grain boundaries from STM and TEM images of thin films.

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页码：187 / 191

页数：5

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