DESIGN AND PERFORMANCE OF A HIGH-TEMPERATURE, HIGH-SPEED SCANNING TUNNELING MICROSCOPE

被引：46

作者：

KUIPERS, L ^{[1
]}

LOOS, RWM ^{[1
]}

NEERINGS, H ^{[1
]}

TERHORST, J ^{[1
]}

RUWIEL, GJ ^{[1
]}

DEJONGH, AP ^{[1
]}

FRENKEN, JWM ^{[1
]}

机构：

[1] FOM,INST ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 09期

关键词：

D O I：

10.1063/1.1145289

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

This article describes the design and performance of a new scanning tunneling microscope (STM) which operates at elevated temperatures and high scanning speeds. To minimize the thermal displacements within the STM, a symmetric configuration was chosen with a large temperature gradient between the sample and the piezoelectric scanner. The thermal behavior of the STM was optimized further by means of a finite element analysis. The high scan rates (10(5) data points/s) are accomplished with fast analogue electronics and a combination of a workstation and three transputers. The STM has imaged surfaces with atomic resolution between room temperature and 750 K, with low residual drifts only two hours after a major temperature change. The sample surface remains within the vertical range of the piezo actuator over a temperature interval of 159 K. (C) 1995 American Institute of Physics.

引用

页码：4557 / 4565

页数：9

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