NOISE BEHAVIOR OF 1-MU-M GATE-LENGTH MODULATION-DOPED FETS FROM 10(-2) TO 10(8) HZ

被引:28
作者
LIU, SM
DAS, MB
KOPP, W
MORKOC, H
机构
[1] PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
[2] UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
[3] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
关键词
D O I
10.1109/EDL.1985.26190
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:453 / 455
页数:3
相关论文
共 9 条
  • [1] BERENZ JJ, 1984, JUN IEEE MTT S INT S, P98
  • [2] BIAS DEPENDENCE AND LIGHT SENSITIVITY OF (AL,GA)AS/GAAS MODFETS AT 77-K
    DRUMMOND, TJ
    FISCHER, RJ
    KOPP, WF
    MORKOC, H
    LEE, K
    SHUR, MS
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (12) : 1806 - 1811
  • [3] ON THE COLLAPSE OF DRAIN I-V-CHARACTERISTICS IN MODULATION-DOPED FETS AT CRYOGENIC TEMPERATURES
    FISCHER, R
    DRUMMOND, TJ
    KLEM, J
    KOPP, W
    HENDERSON, TS
    PERRACHIONE, D
    MORKOC, H
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (08) : 1028 - 1032
  • [4] LOW-FREQUENCY NOISE PHYSICAL ANALYSIS FOR THE IMPROVEMENT OF THE SPECTRAL PURITY OF GAAS-FETS OSCILLATORS
    GRAFFEUIL, J
    TANTRARONGROJ, K
    SAUTEREAU, JF
    [J]. SOLID-STATE ELECTRONICS, 1982, 25 (05) : 367 - 374
  • [5] LINH NT, 1983, AUG P IEEE CORN C HI, P187
  • [6] LIU SM, 1983, MAY P UGIM S, P169
  • [7] Loreck L., 1983, International Electron Devices Meeting 1983. Technical Digest, P107
  • [8] MICROWAVE PERFORMANCE OF 0.25-MU-M GATE LENGTH HIGH ELECTRON-MOBILITY TRANSISTORS
    MISHRA, UK
    PALMATEER, SC
    CHAO, PC
    SMITH, PM
    HWANG, JCM
    [J]. IEEE ELECTRON DEVICE LETTERS, 1985, 6 (03) : 142 - 145
  • [9] A THEORY OF THE HOOGE PARAMETERS OF SOLID-STATE DEVICES
    VANDERZIEL, A
    HANDEL, PH
    ZHU, XC
    DUH, KH
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (03) : 667 - 671