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DEPENDENCE OF DEEP-LEVEL PARAMETERS IN ION-IMPLANTED GAAS-MESFETS ON MATERIAL PREPARATION
被引:15
作者
:
DHAR, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALCUTTA,INST RADIOPHYS & ELECTR,CALCUTTA 700009,W BENGAL,INDIA
DHAR, S
BHATTACHARYA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALCUTTA,INST RADIOPHYS & ELECTR,CALCUTTA 700009,W BENGAL,INDIA
BHATTACHARYA, PK
JUANG, FY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALCUTTA,INST RADIOPHYS & ELECTR,CALCUTTA 700009,W BENGAL,INDIA
JUANG, FY
HONG, WP
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALCUTTA,INST RADIOPHYS & ELECTR,CALCUTTA 700009,W BENGAL,INDIA
HONG, WP
SADLER, RA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALCUTTA,INST RADIOPHYS & ELECTR,CALCUTTA 700009,W BENGAL,INDIA
SADLER, RA
机构
:
[1]
UNIV CALCUTTA,INST RADIOPHYS & ELECTR,CALCUTTA 700009,W BENGAL,INDIA
[2]
ITT GALLIUM ARSENIDE TECHNOL CTR,ROANOKE,VA 24019
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1986年
/ 33卷
/ 01期
关键词
:
D O I
:
10.1109/T-ED.1986.22446
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:111 / 118
页数:8
相关论文
共 24 条
[1]
SOME PROPERTIES OF SEMI-INSULATING AND SI-IMPLANTED GAAS
BHATTACHARYA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
BHATTACHARYA, PK
RHEE, JK
论文数:
0
引用数:
0
h-index:
0
机构:
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
RHEE, JK
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(05)
: 1152
-
1159
[2]
DETECTION OF MINORITY-CARRIER TRAPS USING TRANSIENT SPECTROSCOPY
BRUNWIN, R
论文数:
0
引用数:
0
h-index:
0
机构:
University of Manchester Institute of Science & Technology
BRUNWIN, R
论文数:
引用数:
h-index:
机构:
HAMILTON, B
JORDAN, P
论文数:
0
引用数:
0
h-index:
0
机构:
University of Manchester Institute of Science & Technology
JORDAN, P
PEAKER, AR
论文数:
0
引用数:
0
h-index:
0
机构:
University of Manchester Institute of Science & Technology
PEAKER, AR
[J].
ELECTRONICS LETTERS,
1979,
15
(12)
: 349
-
350
[3]
ROLE OF THE PIEZOELECTRIC EFFECT IN DEVICE UNIFORMITY OF GAAS INTEGRATED-CIRCUITS
CHANG, MF
论文数:
0
引用数:
0
h-index:
0
CHANG, MF
LEE, CP
论文数:
0
引用数:
0
h-index:
0
LEE, CP
ASBECK, PM
论文数:
0
引用数:
0
h-index:
0
ASBECK, PM
VAHRENKAMP, RP
论文数:
0
引用数:
0
h-index:
0
VAHRENKAMP, RP
KIRKPATRICK, CG
论文数:
0
引用数:
0
h-index:
0
KIRKPATRICK, CG
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(03)
: 279
-
281
[4]
CORRELATION OF THRESHOLD VOLTAGE OF IMPLANTED FIELD-EFFECT TRANSISTORS AND CARBON IN GAAS SUBSTRATES
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
HOLMES, DE
论文数:
0
引用数:
0
h-index:
0
HOLMES, DE
ASBECK, PM
论文数:
0
引用数:
0
h-index:
0
ASBECK, PM
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(04)
: 459
-
461
[5]
ELECTRON TRAPS CREATED BY HIGH-TEMPERATURE ANNEALING IN MBE N-GAAS
DAY, DS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
DAY, DS
OBERSTAR, JD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
OBERSTAR, JD
DRUMMOND, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
DRUMMOND, TJ
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
MORKOC, H
CHO, AY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
CHO, AY
STREETMAN, BG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
STREETMAN, BG
[J].
JOURNAL OF ELECTRONIC MATERIALS,
1981,
10
(03)
: 445
-
453
[6]
GROWTH OF HIGH-PURITY SEMI-INSULATING BULK GAAS FOR INTEGRATED-CIRCUIT APPLICATIONS
FAIRMAN, RD
论文数:
0
引用数:
0
h-index:
0
FAIRMAN, RD
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
OLIVER, JR
论文数:
0
引用数:
0
h-index:
0
OLIVER, JR
CHEN, DR
论文数:
0
引用数:
0
h-index:
0
CHEN, DR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 135
-
140
[7]
HOBGOOD HM, 1980, IEEE T ELECTRON DEVI, V28, P140
[8]
EL2 DISTRIBUTIONS IN DOPED AND UNDOPED LIQUID ENCAPSULATED CZOCHRALSKI GAAS
HOLMES, DE
论文数:
0
引用数:
0
h-index:
0
HOLMES, DE
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
YANG, J
论文数:
0
引用数:
0
h-index:
0
YANG, J
[J].
APPLIED PHYSICS LETTERS,
1983,
42
(05)
: 419
-
421
[9]
STABILITY OF PERFORMANCE AND INTERFACIAL PROBLEMS IN GAAS-MESFETS
ITOH, T
论文数:
0
引用数:
0
h-index:
0
ITOH, T
YANAI, H
论文数:
0
引用数:
0
h-index:
0
YANAI, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(06)
: 1037
-
1045
[10]
A SENSITIVE AND INEXPENSIVE SIGNAL ANALYZER FOR DEEP LEVEL STUDIES
JANSSON, L
论文数:
0
引用数:
0
h-index:
0
JANSSON, L
KUMAR, V
论文数:
0
引用数:
0
h-index:
0
KUMAR, V
LEDEBO, LA
论文数:
0
引用数:
0
h-index:
0
LEDEBO, LA
NIDEBORN, K
论文数:
0
引用数:
0
h-index:
0
NIDEBORN, K
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1981,
14
(04):
: 464
-
467
←
1
2
3
→
共 24 条
[1]
SOME PROPERTIES OF SEMI-INSULATING AND SI-IMPLANTED GAAS
BHATTACHARYA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
BHATTACHARYA, PK
RHEE, JK
论文数:
0
引用数:
0
h-index:
0
机构:
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331
RHEE, JK
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(05)
: 1152
-
1159
[2]
DETECTION OF MINORITY-CARRIER TRAPS USING TRANSIENT SPECTROSCOPY
BRUNWIN, R
论文数:
0
引用数:
0
h-index:
0
机构:
University of Manchester Institute of Science & Technology
BRUNWIN, R
论文数:
引用数:
h-index:
机构:
HAMILTON, B
JORDAN, P
论文数:
0
引用数:
0
h-index:
0
机构:
University of Manchester Institute of Science & Technology
JORDAN, P
PEAKER, AR
论文数:
0
引用数:
0
h-index:
0
机构:
University of Manchester Institute of Science & Technology
PEAKER, AR
[J].
ELECTRONICS LETTERS,
1979,
15
(12)
: 349
-
350
[3]
ROLE OF THE PIEZOELECTRIC EFFECT IN DEVICE UNIFORMITY OF GAAS INTEGRATED-CIRCUITS
CHANG, MF
论文数:
0
引用数:
0
h-index:
0
CHANG, MF
LEE, CP
论文数:
0
引用数:
0
h-index:
0
LEE, CP
ASBECK, PM
论文数:
0
引用数:
0
h-index:
0
ASBECK, PM
VAHRENKAMP, RP
论文数:
0
引用数:
0
h-index:
0
VAHRENKAMP, RP
KIRKPATRICK, CG
论文数:
0
引用数:
0
h-index:
0
KIRKPATRICK, CG
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(03)
: 279
-
281
[4]
CORRELATION OF THRESHOLD VOLTAGE OF IMPLANTED FIELD-EFFECT TRANSISTORS AND CARBON IN GAAS SUBSTRATES
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
HOLMES, DE
论文数:
0
引用数:
0
h-index:
0
HOLMES, DE
ASBECK, PM
论文数:
0
引用数:
0
h-index:
0
ASBECK, PM
[J].
APPLIED PHYSICS LETTERS,
1984,
45
(04)
: 459
-
461
[5]
ELECTRON TRAPS CREATED BY HIGH-TEMPERATURE ANNEALING IN MBE N-GAAS
DAY, DS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
DAY, DS
OBERSTAR, JD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
OBERSTAR, JD
DRUMMOND, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
DRUMMOND, TJ
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
MORKOC, H
CHO, AY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
CHO, AY
STREETMAN, BG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
STREETMAN, BG
[J].
JOURNAL OF ELECTRONIC MATERIALS,
1981,
10
(03)
: 445
-
453
[6]
GROWTH OF HIGH-PURITY SEMI-INSULATING BULK GAAS FOR INTEGRATED-CIRCUIT APPLICATIONS
FAIRMAN, RD
论文数:
0
引用数:
0
h-index:
0
FAIRMAN, RD
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
OLIVER, JR
论文数:
0
引用数:
0
h-index:
0
OLIVER, JR
CHEN, DR
论文数:
0
引用数:
0
h-index:
0
CHEN, DR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 135
-
140
[7]
HOBGOOD HM, 1980, IEEE T ELECTRON DEVI, V28, P140
[8]
EL2 DISTRIBUTIONS IN DOPED AND UNDOPED LIQUID ENCAPSULATED CZOCHRALSKI GAAS
HOLMES, DE
论文数:
0
引用数:
0
h-index:
0
HOLMES, DE
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
YANG, J
论文数:
0
引用数:
0
h-index:
0
YANG, J
[J].
APPLIED PHYSICS LETTERS,
1983,
42
(05)
: 419
-
421
[9]
STABILITY OF PERFORMANCE AND INTERFACIAL PROBLEMS IN GAAS-MESFETS
ITOH, T
论文数:
0
引用数:
0
h-index:
0
ITOH, T
YANAI, H
论文数:
0
引用数:
0
h-index:
0
YANAI, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(06)
: 1037
-
1045
[10]
A SENSITIVE AND INEXPENSIVE SIGNAL ANALYZER FOR DEEP LEVEL STUDIES
JANSSON, L
论文数:
0
引用数:
0
h-index:
0
JANSSON, L
KUMAR, V
论文数:
0
引用数:
0
h-index:
0
KUMAR, V
LEDEBO, LA
论文数:
0
引用数:
0
h-index:
0
LEDEBO, LA
NIDEBORN, K
论文数:
0
引用数:
0
h-index:
0
NIDEBORN, K
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1981,
14
(04):
: 464
-
467
←
1
2
3
→