FILM FORMATION MECHANISMS IN THE PLASMA DEPOSITION OF HYDROGENATED AMORPHOUS-SILICON

被引:182
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TSAI, CC
KNIGHTS, JC
CHANG, G
WACKER, B
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10.1063/1.336920
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O59 [应用物理学];
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页码:2998 / 3001
页数:4
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共 18 条
[1]   STEP COVERAGE SIMULATION AND MEASUREMENT IN A DC PLANAR MAGNETRON SPUTTERING SYSTEM [J].
BLECH, IA ;
VANDERPLAS, HA .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (06) :3489-3496
[2]   THE DEPOSITION OF SILICON FROM SILANE IN A LOW-PRESSURE HOT-WALL SYSTEM [J].
CLAASSEN, WAP ;
BLOEM, J ;
VALKENBURG, WGJN ;
VANDENBREKEL, CHJ .
JOURNAL OF CRYSTAL GROWTH, 1982, 57 (02) :259-266
[3]   COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS [J].
DIRKS, AG ;
LEAMY, HJ .
THIN SOLID FILMS, 1977, 47 (03) :219-233
[4]  
GALLAGHER A, 1984 1985 U COL FIN
[5]   GROWTH AND PHYSICAL-PROPERTIES OF LPCVD POLYCRYSTALLINE SILICON FILMS [J].
HARBEKE, G ;
KRAUSBAUER, L ;
STEIGMEIER, EF ;
WIDMER, AE ;
KAPPERT, HF ;
NEUGEBAUER, G .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (03) :675-682
[6]  
KAMPAS FJ, 1984, PREPARATION STRUCTUR, P153
[7]   HIGH-RESOLUTION ABSORPTION AND EMISSION-SPECTROSCOPY OF A SILANE PLASMA IN THE 1800-2300 CM-1 RANGE [J].
KNIGHTS, JC ;
SCHMITT, JPM ;
PERRIN, J ;
GUELACHVILI, G .
JOURNAL OF CHEMICAL PHYSICS, 1982, 76 (07) :3414-3421
[8]   MICROSTRUCTURE OF PLASMA-DEPOSITED A-SI-H FILMS [J].
KNIGHTS, JC ;
LUJAN, RA .
APPLIED PHYSICS LETTERS, 1979, 35 (03) :244-246
[9]  
KNIGHTS JC, 1985, MATER RES SOC S P, V38, P371
[10]   DECOMPOSITION KINETICS OF A STATIC DIRECT-CURRENT SILANE GLOW-DISCHARGE [J].
LONGEWAY, PA ;
ESTES, RD ;
WEAKLIEM, HA .
JOURNAL OF PHYSICAL CHEMISTRY, 1984, 88 (01) :73-77