A CAPACITANCE METER OF HIGH ABSOLUTE SENSITIVITY SUITABLE FOR SCANNING DLTS APPLICATION

被引：28

作者：

BREITENSTEIN, O

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1982年 / 71卷 / 01期

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D O I：

10.1002/pssa.2210710119

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：159 / 167

页数：9

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