ATOMIC FORCE MICROSCOPY FOR THE STUDY OF TRIBOLOGY AND ADHESION

被引：53

作者：

MEYER, E

HEINZELMANN, H

GRUTTER, P

JUNG, T

HIDBER, HR

RUDIN, H

GUNTHERODT, HJ

机构：

来源：

THIN SOLID FILMS | 1989年 / 181卷

关键词：

D O I：

10.1016/0040-6090(89)90522-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：527 / 544

页数：18

共 37 条

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602

[2] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274

[3] IMAGING AND MODIFICATION OF POLYMERS BY SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY [J].

ALBRECHT, TR ;

DOVEK, MM ;

LANG, CA ;

GRUTTER, P ;

QUATE, CF ;

KUAN, SWJ ;

FRANK, CW ;

PEASE, RFW .

JOURNAL OF APPLIED PHYSICS, 1988, 64 (03) :1178-1184

[4] AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].

ALEXANDER, S ;

HELLEMANS, L ;

MARTI, O ;

SCHNEIR, J ;

ELINGS, V ;

HANSMA, PK ;

LONGMIRE, M ;

GURLEY, J .

JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167

[5]

BINNIG G, 1986, IBM J RES DEV, V30, P355

[6] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[7] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

GERBER, C ;

STOLL, E ;

ALBRECHT, TR ;

QUATE, CF .

EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286

[8]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[9] POLARIZED ELECTRON PROBES OF MAGNETIC-SURFACES [J].

CELOTTA, RJ ;

PIERCE, DT .

SCIENCE, 1986, 234 (4774) :333-340

[10]

Dimigen H., 1983, Philips Technical Review, V41, P186

← 1 2 3 4 →