A SIMPLE SEMIQUANTITATIVE MODEL FOR CLASSIFYING METAL COMPOUND SEMICONDUCTOR INTERFACE REACTIVITY

被引:20
作者
MCGILP, JF [1 ]
MCGOVERN, IT [1 ]
机构
[1] UNIV DUBLIN TRINITY COLL,DEPT PURE & APPL PHYS,DUBLIN,IRELAND
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1985年 / 3卷 / 06期
关键词
D O I
10.1116/1.582954
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1641 / 1644
页数:4
相关论文
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