REDUCED PRESSURE SILICON EPITAXY - A REVIEW

被引:13
作者
CULLEN, GW
CORBOY, JF
机构
关键词
D O I
10.1016/0022-0248(84)90271-9
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:230 / 252
页数:23
相关论文
共 41 条
[31]  
SHANFIELD SR, 1983, MAY M EL SOC SAN FRA, P230
[33]   AUTODOPING EFFECTS IN SILICON EPITAXY [J].
SRINIVASAN, GR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (06) :1334-1342
[34]   KINETICS OF LATERAL AUTO-DOPING IN SILICON EPITAXY [J].
SRINIVASAN, GR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (01) :146-151
[35]  
SUGAWARA K, 1970, 2 P INT C CHEM VAP D, P713
[36]   EFFECT OF SI-GE BUFFER LAYER FOR LOW-TEMPERATURE SI EPITAXIAL-GROWTH ON SI SUBSTRATE BY RF PLASMA CHEMICAL VAPOR-DEPOSITION [J].
SUZUKI, S ;
ITOH, T .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (03) :1466-1470
[37]   GAS-FLOW PATTERN AND MASS-TRANSFER ANALYSIS IN A HORIZONTAL FLOW REACTOR FOR CHEMICAL VAPOR-DEPOSITION [J].
TAKAHASHI, R ;
SUGAWARA, K ;
KOGA, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (10) :1406-+
[38]  
TAKAHASHI R, 1970, 2ND P INT C CHEM VAP, P695
[39]   EPITAXIAL-GROWTH OF SILICON FROM SIH4 IN TEMPERATURE-RANGE 800-1150 DEGREES C [J].
TOWNSEND, WG ;
UDDIN, ME .
SOLID-STATE ELECTRONICS, 1973, 16 (01) :39-42
[40]  
VONDERROPP H, 1982, COMMUNICATION