CHEMICAL VAPOR-DEPOSITION OF SILICON UNDER REDUCED PRESSURE IN HOT-WALL REACTORS

被引:60
作者
WILKE, TE
TURNER, KA
TAKOUDIS, CG
机构
[1] Purdue Univ, West Lafayette, IN, USA, Purdue Univ, West Lafayette, IN, USA
关键词
CHEMICAL VAPOR DEPOSITION - HOT WALL DEPOSITION REACTORS - LOW PRESSURE TUBULAR REACTOR - POLYSILICON - SILANE DECOMPOSITION;
D O I
10.1016/0009-2509(86)87141-X
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
(Edited Abstract)
引用
收藏
页码:643 / 650
页数:8
相关论文
共 16 条
[11]   PHOSPHORUS-DOPED POLYCRYSTALLINE SILICON VIA LPCVD .1. PROCESS CHARACTERIZATION [J].
MEYERSON, BS ;
OLBRICHT, W .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (10) :2361-2365
[12]   SILICON DEPOSITION ON A ROTATING-DISK [J].
POLLARD, R ;
NEWMAN, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) :744-752
[13]   ANALYSIS OF MULTICOMPONENT LPCVD PROCESSES - DEPOSITION OF PURE AND INSITU DOPED POLY-SI [J].
ROENIGK, KF ;
JENSEN, KF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (02) :448-454
[14]  
ROSLER RS, 1977, SOLID STATE TECHNOL, V20, P63
[15]   LOW-PRESSURE DEPOSITION OF POLYCRYSTALLINE SILICON FROM SILANE [J].
VANDENBREKEL, CHJ ;
BOLLEN, LJM .
JOURNAL OF CRYSTAL GROWTH, 1981, 54 (02) :310-322
[16]  
WILKE TE, 1986, UNPUB J CRYSTAL GROW