A MULTILAYER MODEL FOR GAAS OXIDES FORMED AT ROOM-TEMPERATURE IN AIR AS DEDUCED FROM AN XPS ANALYSIS

被引：29

作者：

DEMANET, CM

MARAIS, MA

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1985年 / 7卷 / 01期

关键词：

D O I：

10.1002/sia.740070104

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：13 / 16

页数：4

共 12 条

[1] RELAXATION DURING PHOTOEMISSION AND LMM AUGER DECAY IN ARSENIC AND SOME OF ITS COMPOUNDS [J].

BAHL, MK ;

WOODALL, RO ;

WATSON, RL ;

IRGOLIC, KJ .

JOURNAL OF CHEMICAL PHYSICS, 1976, 64 (03) :1210-1218

[2] APPLICATION OF FOURIER-TRANSFORM TECHNIQUES TO PROBLEM OF DECONVOLUTION IN PHOTOELECTRON-SPECTROSCOPY [J].

BEATHAM, N ;

ORCHARD, AF .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (02) :129-148

[3] APPLICATION OF DECONVOLUTION METHODS IN ELECTRON-SPECTROSCOPY - REVIEW [J].

CARLEY, AF ;

JOYNER, RW .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 16 (1-2) :1-23

[4]

GRANT H, 1981, SURF SCI, V105, P217

[5] LOCAL ATOMIC AND ELECTRONIC-STRUCTURE OF OXIDE-GAAS AND SIO2-SI INTERFACES USING HIGH-RESOLUTION XPS [J].

GRUNTHANER, FJ ;

GRUNTHANER, PJ ;

VASQUEZ, RP ;

LEWIS, BF ;

MASERJIAN, J ;

MADHUKAR, A .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05) :1443-1453

[6] CHEMICAL DEPTH PROFILES OF THE GAAS-NATIVE OXIDE INTERFACE [J].

GRUNTHANER, PJ ;

VASQUEZ, RP ;

GRUNTHANER, FJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05) :1045-1051

[7] X-RAY PHOTOEMISSION STUDY OF OXIDATION PROCESS AT CLEAVED (110) SURFACES OF GAAS, GAP AND INSB [J].

IWASAKI, H ;

MIZOKAWA, Y ;

NISHITANI, R ;

NAKAMURA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (11) :1925-1933

[8] A CHEMICAL BONDING MODEL FOR THE NATIVE OXIDES OF THE III-V COMPOUND SEMICONDUCTORS [J].

LUCOVSKY, G .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :456-462

[9] ANALYSIS OF NATIVE OXIDE-FILMS AND OXIDE SUBSTRATE REACTIONS ON III-V-SEMICONDUCTORS USING THERMOCHEMICAL PHASE-DIAGRAMS [J].

SCHWARTZ, GP .

THIN SOLID FILMS, 1983, 103 (1-2) :3-16

[10] X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF NATIVE OXIDES ON GAAS [J].

SCHWARTZ, GP ;

GUALTIERI, GJ ;

KAMMLOTT, GW ;

SCHWARTZ, B .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (10) :1737-1749

← 1 2 →