RAMAN-SCATTERING CHARACTERIZATION OF THE MICROSCOPIC STRUCTURE OF SEMI-INSULATING POLYCRYSTALLINE SI THIN-FILMS

被引：19

作者：

OLEGO, DJ

BAUMGART, H

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 08期

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D O I：

10.1063/1.341007

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：2669 / 2673

页数：5

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