FORMATION OF IN-AS COMPLEXES IN SILICON OBSERVED BY THE PERTURBED ANGULAR-CORRELATION TECHNIQUE

被引:26
作者
WICHERT, T
SWANSON, ML
QUENNEVILLE, AF
机构
关键词
D O I
10.1103/PhysRevLett.57.1757
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:1757 / 1760
页数:4
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