MODELING OF DEFECT PHOSPHORUS PAIR DIFFUSION IN PHOSPHORUS-IMPLANTED SILICON

被引:13
作者
JAGER, HU
FEUDEL, T
ULBRICHT, S
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1989年 / 116卷 / 02期
关键词
D O I
10.1002/pssa.2211160215
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:571 / 581
页数:11
相关论文
共 30 条
  • [1] DIFFUSION OF IMPURITIES FROM IMPLANTED SILICON LAYERS BY RAPID THERMAL ANNEALING
    ALEKSANDROV, OV
    KOZLOVSKII, VV
    POPOV, VV
    SAMORUKOV, BE
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 110 (02): : K61 - K65
  • [2] INFLUENCE OF PRECIPITATION ON PHOSPHORUS DIFFUSIVITY IN SILICON
    ANGELUCCI, R
    SOLMI, S
    ZINI, Q
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 96 (02): : 541 - 546
  • [3] MODELS FOR COMPUTER-SIMULATION OF COMPLETE IC FABRICATION PROCESS
    ANTONIADIS, DA
    DUTTON, RW
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (04) : 490 - 500
  • [4] BUDIL M, 1988, IN PRESS 15TH P INT
  • [5] Burenkov A. F., 1985, PROSTRANSTVENNIE RAS
  • [6] TRANSIENT ENHANCED DIFFUSION OF PHOSPHORUS IN SILICON
    COWERN, NEB
    GODFREY, DJ
    SYKES, DE
    [J]. APPLIED PHYSICS LETTERS, 1986, 49 (25) : 1711 - 1713
  • [7] SUPERSATURATION OF SELF-INTERSTITIALS AND UNDERSATURATION OF VACANCIES DURING PHOSPHORUS DIFFUSION IN SILICON
    FAHEY, P
    DUTTON, RW
    HU, SM
    [J]. APPLIED PHYSICS LETTERS, 1984, 44 (08) : 777 - 779
  • [8] FAHEY P, 1986, SEMICONDUCTOR SILICO, P571
  • [9] QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT
    FAIR, RB
    TSAI, JCC
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) : 1107 - 1118
  • [10] FEUDEL T, 1988, TESIM2