INFLUENCE OF PRECIPITATION ON PHOSPHORUS DIFFUSIVITY IN SILICON

被引:7
作者
ANGELUCCI, R
SOLMI, S
ZINI, Q
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1986年 / 96卷 / 02期
关键词
D O I
10.1002/pssa.2210960221
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:541 / 546
页数:6
相关论文
共 27 条
[1]   PRECIPITATION AND DIFFUSIVITY OF ARSENIC IN SILICON [J].
ANGELUCCI, R ;
CELOTTI, G ;
NOBILI, D ;
SOLMI, S .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (11) :2726-2730
[2]   GROWTH OF STACKING-FAULTS AND DISLOCATIONS INDUCED IN SILICON BY PHOSPHORUS PREDEPOSITION [J].
ARMIGLIATO, A ;
SERVIDORI, M ;
SOLMI, S ;
VECCHI, I .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (05) :1806-1812
[3]   HREM OF SIP PRECIPITATES AT THE (111) SILICON SURFACE DURING PHOSPHORUS PREDEPOSITION [J].
BOURRET, A ;
SCHROTER, W .
ULTRAMICROSCOPY, 1984, 14 (1-2) :97-106
[4]   ANODIC-OXIDATION OF POLYSILICON [J].
BULDINI, PL ;
ZINI, Q ;
FERRI, D .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (05) :1062-1064
[5]   DAMAGE RECOVERY AND DOPANT ACTIVATION PHENOMENA IN HEAVILY ARSENIC-IMPLANTED SILICON [J].
CEROFOLINI, GF ;
MANINI, P ;
MEDA, L ;
PIGNATEL, GU ;
QUEIROLO, G ;
GARULLI, A ;
LANDI, E ;
SOLMI, S ;
NAVA, F ;
OTTAVIANI, G ;
GALLORINI, M .
THIN SOLID FILMS, 1985, 129 (1-2) :111-125
[6]   EFFECT OF THERMAL NITRIDATION PROCESSES ON BORON AND PHOSPHORUS DIFFUSION IN (100) SILICON [J].
FAHEY, P ;
DUTTON, RW ;
MOSLEHI, M .
APPLIED PHYSICS LETTERS, 1983, 43 (07) :683-685
[7]   KINETICS OF THERMAL NITRIDATION PROCESSES IN THE STUDY OF DOPANT DIFFUSION MECHANISMS IN SILICON [J].
FAHEY, P ;
BARBUSCIA, G ;
MOSLEHI, M ;
DUTTON, RW .
APPLIED PHYSICS LETTERS, 1985, 46 (08) :784-786
[8]   SUPERSATURATION OF SELF-INTERSTITIALS AND UNDERSATURATION OF VACANCIES DURING PHOSPHORUS DIFFUSION IN SILICON [J].
FAHEY, P ;
DUTTON, RW ;
HU, SM .
APPLIED PHYSICS LETTERS, 1984, 44 (08) :777-779
[9]  
FAHEY P, 1983, J APPL PHYS, V54, P6912
[10]   ELECTRICAL-PROPERTIES AND STABILITY OF SUPERSATURATED PHOSPHORUS-DOPED SILICON LAYERS [J].
FINETTI, M ;
NEGRINI, P ;
SOLMI, S ;
NOBILI, D .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (06) :1313-1317