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A COMPARISON OF MOS INVERSION LAYER CHARGE AND CAPACITANCE FORMULAS
被引:11
作者
:
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
机构
:
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1986年
/ 33卷
/ 02期
关键词
:
D O I
:
10.1109/T-ED.1986.22462
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:182 / 187
页数:6
相关论文
共 8 条
[1]
ACCURACY OF THEORETICAL HIGH-FREQUENCY SEMICONDUCTOR CAPACITANCE FOR INVERTED MOS STRUCTURES
论文数:
引用数:
h-index:
机构:
BACCARANI, G
论文数:
引用数:
h-index:
机构:
SEVERI, M
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1974,
ED21
(01)
: 122
-
125
[2]
CHARGE-SHEET MODEL OF MOSFET
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
[J].
SOLID-STATE ELECTRONICS,
1978,
21
(02)
: 345
-
355
[3]
IMPROVED HIGH-FREQUENCY MOS CAPACITANCE FORMULA
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS,MURRAY HILL,NJ 07974
BELL TEL LABS,MURRAY HILL,NJ 07974
BREWS, JR
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(03)
: 1276
-
1279
[4]
ERROR ANALYSIS OF HIGH-FREQUENCY MOS CAPACITANCE CALCULATIONS
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BREWS, JR
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(05)
: 447
-
456
[5]
GROVE AS, 1967, PHYS TECHNOL S, P267
[6]
AN IGFET INVERSION CHARGE MODEL FOR VLSI SYSTEMS
LEWYN, LL
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
LEWYN, LL
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
MEINDL, JD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
: 434
-
440
[7]
SIMPLIFIED LONG-CHANNEL MOSFET THEORY
PIERRET, RF
论文数:
0
引用数:
0
h-index:
0
PIERRET, RF
SHIELDS, JA
论文数:
0
引用数:
0
h-index:
0
SHIELDS, JA
[J].
SOLID-STATE ELECTRONICS,
1983,
26
(02)
: 143
-
147
[8]
Sze S.M., 1981, PHYS OFSEMICONDUCTOR, V2nd, P366
←
1
→
共 8 条
[1]
ACCURACY OF THEORETICAL HIGH-FREQUENCY SEMICONDUCTOR CAPACITANCE FOR INVERTED MOS STRUCTURES
论文数:
引用数:
h-index:
机构:
BACCARANI, G
论文数:
引用数:
h-index:
机构:
SEVERI, M
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1974,
ED21
(01)
: 122
-
125
[2]
CHARGE-SHEET MODEL OF MOSFET
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
BREWS, JR
[J].
SOLID-STATE ELECTRONICS,
1978,
21
(02)
: 345
-
355
[3]
IMPROVED HIGH-FREQUENCY MOS CAPACITANCE FORMULA
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS,MURRAY HILL,NJ 07974
BELL TEL LABS,MURRAY HILL,NJ 07974
BREWS, JR
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(03)
: 1276
-
1279
[4]
ERROR ANALYSIS OF HIGH-FREQUENCY MOS CAPACITANCE CALCULATIONS
BREWS, JR
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BREWS, JR
[J].
SOLID-STATE ELECTRONICS,
1974,
17
(05)
: 447
-
456
[5]
GROVE AS, 1967, PHYS TECHNOL S, P267
[6]
AN IGFET INVERSION CHARGE MODEL FOR VLSI SYSTEMS
LEWYN, LL
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
LEWYN, LL
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305
MEINDL, JD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
: 434
-
440
[7]
SIMPLIFIED LONG-CHANNEL MOSFET THEORY
PIERRET, RF
论文数:
0
引用数:
0
h-index:
0
PIERRET, RF
SHIELDS, JA
论文数:
0
引用数:
0
h-index:
0
SHIELDS, JA
[J].
SOLID-STATE ELECTRONICS,
1983,
26
(02)
: 143
-
147
[8]
Sze S.M., 1981, PHYS OFSEMICONDUCTOR, V2nd, P366
←
1
→