MATERIAL EFFECTS ON THE CRACKING EFFICIENCY OF MOLECULAR-BEAM EPITAXY ARSENIC CRACKING FURNACES

被引:9
作者
LEE, RL
SCHAFFER, WJ
CHAI, YG
LIU, D
HARRIS, JS
机构
[1] VARIAN ASSOCIATES,CORP RES CTR,PALO ALTO,CA 94303
[2] STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1986年 / 4卷 / 02期
关键词
D O I
10.1116/1.583375
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:568 / 570
页数:3
相关论文
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