PROBABILISTIC ANALYSIS OF RANDOM TEST GENERATION METHOD FOR IRREDUNDANT COMBINATIONAL LOGIC NETWORKS

被引：31

作者：

AGRAWAL, P

AGRAWAL, VD

机构：

[1] INDIAN INST TECHNOL, SCH RADAR STUDIES, NEW DELHI 29, INDIA

[2] INDIAN INST TECHNOL, COMP CTR, NEW DELHI 29, INDIA

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1975年 / C 24卷 / 07期

关键词：

D O I：

10.1109/T-C.1975.224289

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：691 / 695

页数：5

共 17 条

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