OPTICAL-PROPERTIES OF ANODICALLY GROWN NATIVE OXIDES ON SOME GA-V COMPOUNDS FROM 1.5 TO 6.0 EV

被引：91

作者：

ASPNES, DE ^{[1
]}

SCHWARTZ, B ^{[1
]}

STUDNA, AA ^{[1
]}

DERICK, L ^{[1
]}

KOSZI, LA ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

JOURNAL OF APPLIED PHYSICS | 1977年 / 48卷 / 08期

关键词：

D O I：

10.1063/1.324200

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3510 / 3513

页数：4

共 29 条

[1]

Aspnes D. E., 1973, Optics Communications, V8, P222, DOI 10.1016/0030-4018(73)90132-6

[2]

Aspnes D. E., 1976, OPTICAL PROPERTIES S, P799

[3] OPTICAL CHARACTERIZATION OF A NATIVE OXIDE ANODICALLY GROWN ON GALLIUM ANTIMONIDE [J].

ASPNES, DE ;

SCHWARTZ, B ;

STUDNA, AA ;

DERICK, L .

APPLIED PHYSICS LETTERS, 1976, 28 (10) :631-632

[4] OPTIMIZING PRECISION OF ROTATING-ANALYZER ELLIPSOMETERS [J].

ASPNES, DE .

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[5] HIGH PRECISION SCANNING ELLIPSOMETER [J].

ASPNES, DE ;

STUDNA, AA .

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[6] EXTENDING SCANNING ELLIPSOMETRIC SPECTRA INTO EXPERIMENTALLY INACCESSIBLE REGIONS [J].

ASPNES, DE .

SURFACE SCIENCE, 1976, 56 (01) :322-333

[7] EXTENDED SPECTROSCOPY WITH HIGH-RESOLUTION SCANNING ELLIPSOMETRY [J].

ASPNES, DE .

PHYSICAL REVIEW B, 1975, 12 (10) :4008-4011

[8] EFFECTS OF COMPONENT OPTICAL-ACTIVITY IN DATA REDUCTION AND CALIBRATION OF ROTATING-ANALYZER ELLIPSOMETERS [J].

ASPNES, DE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (06) :812-819

[9]

BARNES PA, 1977, APPL PHYS LETT, V30, P24

[10] ELLIPSOMETRY OF ANODIC OXIDE FILMS ON GAAS [J].

DELLOCA, CJ ;

YAN, G ;

YOUNG, L .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (01) :89-&

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