X-RAY STANDING WAVE ANALYSIS OF BISMUTH IMPLANTED IN SI(110)

[1] NEW APPLICATIONS OF X-RAY STANDING-WAVE FIELDS TO SOLID-STATE PHYSICS [J]. PHYSICAL REVIEW LETTERS, 1976, 37 (17) : 1141 - 1145

[2] SUPERSATURATED SOLID-SOLUTIONS AFTER SOLID-PHASE EPITAXIAL-GROWTH IN BI-IMPLANTED SILICON [J]. APPLIED PHYSICS LETTERS, 1980, 37 (02) : 170 - 172

[3] IMPLANTATION AND ANNEALING BEHAVIOR OF GROUP 3 AND V DOPANTS IN SILICON AS STUDIED BY CHANNELING TECHNIQUE [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (02) : 842 - +

[4] Frank W., 1981, Defects in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P31

[5] OBSERVATION OF INTERNAL X-RAY WAVE FIELDS DURING BRAGG-DIFFRACTION WITH AN APPLICATION TO IMPURITY LATTICE LOCATION [J]. PHYSICAL REVIEW B, 1974, 10 (10) : 4239 - 4243

[6] CHANNELING MEASUREMENTS IN AS-DOPED SI [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (08) : 3425 - &

[7] KOOL WH, 1976, NUCL INSTRUM METHODS, V132, P285, DOI 10.1016/0029-554X(76)90747-3

[8] A FEEDBACK-CONTROL SYSTEM FOR SYNCHROTRON RADIATION DOUBLE CRYSTAL INSTRUMENTS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 219 (02) : 430 - 434

[9] A DYNAMIC CONTROL AND MEASURING SYSTEM FOR SYNCHROTRON X-RAY ROCKING CURVES [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3): : 613 - 619

[10] LANNOO M, SPRINGER SERIES SOLI, V22, P19

[1] NEW APPLICATIONS OF X-RAY STANDING-WAVE FIELDS TO SOLID-STATE PHYSICS [J]. PHYSICAL REVIEW LETTERS, 1976, 37 (17) : 1141 - 1145

[2] SUPERSATURATED SOLID-SOLUTIONS AFTER SOLID-PHASE EPITAXIAL-GROWTH IN BI-IMPLANTED SILICON [J]. APPLIED PHYSICS LETTERS, 1980, 37 (02) : 170 - 172

[3] IMPLANTATION AND ANNEALING BEHAVIOR OF GROUP 3 AND V DOPANTS IN SILICON AS STUDIED BY CHANNELING TECHNIQUE [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (02) : 842 - +

[4] Frank W., 1981, Defects in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P31

[5] OBSERVATION OF INTERNAL X-RAY WAVE FIELDS DURING BRAGG-DIFFRACTION WITH AN APPLICATION TO IMPURITY LATTICE LOCATION [J]. PHYSICAL REVIEW B, 1974, 10 (10) : 4239 - 4243

[6] CHANNELING MEASUREMENTS IN AS-DOPED SI [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (08) : 3425 - &

[7] KOOL WH, 1976, NUCL INSTRUM METHODS, V132, P285, DOI 10.1016/0029-554X(76)90747-3

[8] A FEEDBACK-CONTROL SYSTEM FOR SYNCHROTRON RADIATION DOUBLE CRYSTAL INSTRUMENTS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 219 (02) : 430 - 434

[9] A DYNAMIC CONTROL AND MEASURING SYSTEM FOR SYNCHROTRON X-RAY ROCKING CURVES [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3): : 613 - 619

[10] LANNOO M, SPRINGER SERIES SOLI, V22, P19