LATCHUP PERFORMANCE OF RETROGRADE AND CONVENTIONAL N-WELL CMOS TECHNOLOGIES

被引：38

作者：

LEWIS, AG

MARTIN, RA

HUANG, TY

CHEN, JY

KOYANAGI, M

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1987年 / 34卷 / 10期

关键词：

D O I：

10.1109/T-ED.1987.23211

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2156 / 2164

页数：9

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