SCANNED LIGHT-PULSE TECHNIQUE FOR THE INVESTIGATION OF INSULATOR SEMICONDUCTOR INTERFACES

被引：61

作者：

ENGSTROM, O

CARLSSON, A

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 09期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.332752

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：5245 / 5251

页数：7

相关论文

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