SURFACE CHARACTERIZATION

[131] REACTIVE INTER-DIFFUSION AT METAL-CDS AND METAL-CDSE INTERFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 787 - 791

[132] SCHOTTKY-BARRIER MODULATION AT METAL CONTACTS TO CDS AND CDSE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02): : 590 - 593

[133] REACTIVE INTER-DIFFUSION AND ELECTRONIC BARRIERS AT METAL-CDS AND METAL-CDSE INTERFACES - CONTROL OF SCHOTTKY-BARRIER HEIGHT USING REACTIVE INTERLAYERS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 617 - 622

[134] COMBINED SIMS/XPS STUDIES OF ADSORPTION AT SINGLE-CRYSTAL COPPER, NICKEL AND COPPER NICKEL SURFACES [J]. VACUUM, 1981, 31 (10-1) : 491 - 491

[135] BUDHANI RC, 1982, THIN SOLID FILMS, V89, P73, DOI 10.1016/0040-6090(82)90477-1

[136] BUJOR M, 1982, J VAC SCI TECHNOL, V20, P392, DOI 10.1116/1.571474

[137] CHARACTERIZATION OF THE MATERIALS COMPRISING THE REACTIVE INTERFACES IN THE LI(SI)-FES2 PRIMARY BATTERY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (09) : 1919 - 1926

[138] BUZANEVA EV, 1981, SOV PHYS SEMICOND+, V15, P155

[139] DAMAGE INDUCED THROUGH MEGAVOLT ARSENIC IMPLANTATION INTO SILICON [J]. APPLIED PHYSICS LETTERS, 1982, 41 (06) : 537 - 539

[140] A LEED STUDY OF ADSORBED NEON ON GRAPHITE [J]. SURFACE SCIENCE, 1982, 115 (03) : 455 - 468

[131] REACTIVE INTER-DIFFUSION AT METAL-CDS AND METAL-CDSE INTERFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 787 - 791

[132] SCHOTTKY-BARRIER MODULATION AT METAL CONTACTS TO CDS AND CDSE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02): : 590 - 593

[133] REACTIVE INTER-DIFFUSION AND ELECTRONIC BARRIERS AT METAL-CDS AND METAL-CDSE INTERFACES - CONTROL OF SCHOTTKY-BARRIER HEIGHT USING REACTIVE INTERLAYERS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 617 - 622

[134] COMBINED SIMS/XPS STUDIES OF ADSORPTION AT SINGLE-CRYSTAL COPPER, NICKEL AND COPPER NICKEL SURFACES [J]. VACUUM, 1981, 31 (10-1) : 491 - 491

[135] BUDHANI RC, 1982, THIN SOLID FILMS, V89, P73, DOI 10.1016/0040-6090(82)90477-1

[136] BUJOR M, 1982, J VAC SCI TECHNOL, V20, P392, DOI 10.1116/1.571474

[137] CHARACTERIZATION OF THE MATERIALS COMPRISING THE REACTIVE INTERFACES IN THE LI(SI)-FES2 PRIMARY BATTERY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (09) : 1919 - 1926

[138] BUZANEVA EV, 1981, SOV PHYS SEMICOND+, V15, P155

[139] DAMAGE INDUCED THROUGH MEGAVOLT ARSENIC IMPLANTATION INTO SILICON [J]. APPLIED PHYSICS LETTERS, 1982, 41 (06) : 537 - 539

[140] A LEED STUDY OF ADSORBED NEON ON GRAPHITE [J]. SURFACE SCIENCE, 1982, 115 (03) : 455 - 468